C-Tec Microlab ML3700

The Microlab product family is designed to prepare cross sections of conductor crimps and insulation crimps easily and comfortably within a few minutes. After cutting, polishing and etching of the sample, the image of the cross section can be visualized on the screen. Now a comprehensive quality check of the crimp can be performed by using the special designed image processing software X-Scan.

Equipped with a high quality 12x zoom objective the Microlab ML 3700 is the ideal tool to conduct quality tests quick and comfortable. The high-resolution camera delivers first-class digital colour pictures which can be easily measured with the automatic function of the image processing software X-Scan. Automatically generated records can be used as proofs of quality. Of course, X-Scan fulfills all relevant DIN standards and OEM specifications.

Performance features

• Complete micrograph laboratory integrated in an MDF board
• Easily operated optic with 12x zoom objective with an outstanding combination of zoom and resolution
• First-class digital colour camera USB 3.0 with CMOS sensor and a resolution of 3072x2048 pixels
• Well suited for cross sections from 0.1 to 10 mm² (AWG 28 – AWG 10)
• Comfortable analysis software X-Scan

Optional:

• Integrated Cut Camera (VCS) for exact cut control, easily operated by touch display
• ancillary lens 0.5x or 0.25x for extended applications
• ML 3700-pc version with integrated mini PC incl. Windows 11 prof. licence, monitor, mouse and keyboard)