The C-Tec Microlab ML3600 is a benchtop micrography laboratory designed for the fast and efficient analysis of different metallographic crimp cross-sections.
After the sample has been cut, polished and electrolytically cleaned, the Microlab ML3600 allows the image to be displayed on screen and enables crimp quality control using the dedicated X-Scan image processing software.
Equipped with proven 4x zoom optics and a USB 3.0 colour digital camera with a CMOS sensor and 2592 × 1944 pixel resolution, the ML3600 provides high-quality digital images for accurate cross-section analysis.
The X-Scan software enables simple and convenient crimp analysis while complying with relevant DIN standards and OEM specifications. Automatically generated records can be used as quality documentation and proof of quality.
With support for cross-sections from 0.1 to 10 mm² (AWG 28 – AWG 10), the C-Tec Microlab ML3600 is a practical and cost-effective solution for crimp quality control in the wire harness industry.
| Specification | Value |
|---|---|
| Equipment Type | Benchtop micrography laboratory |
| Application | Metallographic cross-section analysis and crimp quality control |
| Format | Complete micrography laboratory integrated into a benchtop unit |
| Optics | 4x zoom |
| Camera | USB 3.0 colour digital camera, CMOS sensor |
| Resolution | 2592 × 1944 pixels |
| Cross-Sections | 0.1–10 mm² (AWG 28 – AWG 10) |
| Analysis Software | X-Scan |
| Standards and Specifications | Relevant DIN standards and OEM specifications |
| Documentation | Automatically generated records |
| Optional Version | ML 3600-PC with integrated mini PC, Windows 11 Professional, monitor, mouse and keyboard |
